Mactempas

Instrumentation

Empa's Electron Microscopy Center operates a modern infrastructure of electron microscopy equipment for materials and nano-science. Besides scanning electron microscopes and (scanning) transmission electron microscopes equipped with analytical devices, the center maintains facilities for sample preparation of solid (nano-)materials. For advanced data analysis various software packages, including software for simulations are available.

Transmission Electron Microscopes

Total Resolution.
The relaxed block is used as input for the (multislice) MacTempas image simulation program by Kilaas 69 after replacing the effective atoms by the true Mg-O (or Mn-O) unit and taking an oxygen layer as the terminating layer of the oxide.
The high resolution phase contrast simulation was performed using the Crystalkit and MacTempas software packages. Atomic resolution Z-contrast microscopy 43, 44, 45 was used for the systematic examination of the composition and structure of the Ω plate/matrix (001) Ω ‖(111) α interface as a function of time and temperature.
Fellowship Opportunities. Some Modest Advice for Graduate Students by Stephen C. Stearns, Ph.D., Yale University. Candidates: Check out the latest presentation by the Graduate School and College of Engineering: Crafting a Competitive Application and Funding 101 (download) The Ohio State University database. External Funding Options in the College of Engineering @ The Ohio State.

FEI Titan Themis

The Titan Themis, operational at 80 and 300 kV, provides highest resolution imaging capabilties for analytics and particularly for in-situ and in-operando measuremetns. The microscope is equipped with a hexapole-type aberration corrector for scanning transmission electron microscope (CEOS DCOR) and a SuperEDX system. In-situ sample holders from Protochips can be used for liquid cell measurements and thermo-electrical measurements. A fast gun valve provides additional safety for in-situ experiments. (Installed: 2016)

Main features & techniques:

High-resolution scanning transmission electron microscopy (<60 pm)
SuperEDX system
Differential phase contrast imaging (DPC and iDPC)
Tomography (STEM & TEM)
Electrostatic biprism for electron holography
Lorentz lens
FEI CETA 2 camera (16 Mpixel, up to 40 fps at full resolution)
Protochips Poseidon holder (dual flow and heating)
Protochips Fusion 500 holder (double-tilt)

JEOL JEM2200fs

Mactemps

The JEOL JEM 2200fs (scanning) transmission electron microscope is an analytical multifunctional microscope equipped with a Schottky field-emission electron source. It features an Omega-type electron energy filter, an energy-dispersive X-ray spectrometer, a scanning unit and a variety of different sample holders.

Main features & techniques:

High-resolution imaging in TEM and STEM mode (~2 Å resolution)
Analytics: EELS, EFTEM & EDX
Tomography
Holders: tomography, liquid-nitrogen, heating, quartet, Be-single and Be-double tilt
Gatan DigiScan II

Installed: 2009

JEOL ARM200F

Owned by and installed at IBM Zurich, staff of Empa's Electron Microscopy Center jointly operates this double-aberration-corrected (scanning) transmission electron microscope with a team of IBM scientists. The microscope is installed in a noise-free lab of the Binning-Rohrer Nanotechnology Center and is equipped with a cold field-emission electron source, a high-efficiency EDX detector, a electron energy-loss spectrometer and two correctors for the spherical aberration, one for the scanning transmission mode and one for the broad-beam transmission mode.

Main features & techniques:

High-resolution imaging in TEM and STEM mode (<1 Å resolution)
Operational at 80, 120 and 200 kV
Analytics: EELS & EDX
Gatan DigiScan II

Installed: 2014

Scanning Electron Microscopes

FEI NanoSEM 230

Masstemps Aquent

The NanoSEM 230 is a multifunctional field-emission scanning electron microscopes which is jointly owned and operated with EAWAG. It features:

Low-vacuum and low-voltages modi
Scanning transmission mode
High-efficiency Oxford X-Max SDD EDX system
Variety of detectors for signal optimization

Installed: 2009

FEI Quanta 650 FEG ESEM

The FEI Quanta 650 is a multifunctional field-emission scanning electron microscopes with environmental SEM capabilities. It features:

High-vacuum, low-vacuum and environmental (<26 mbar H₂O) modi
Peltier/heating sample stage
Thermo Fischer Pathfinder SDD EDX system
Tensile stage
Variety of detectors for signal optimization

Installed: 2017

Mactemps Software

Sample Preparation

Ion mill Fischione Model 1050 TEM Mill
Plasma cleaner Fischione 1020
Dimple grinder
Tripod polisher
Manual mechanical polisher Struers
Automatic mechanical polisher: Allied MultiPrep 8'
Microtome Ultracut
Sputterer Leica ACE600
Carbon coater Safematic CCU-010
Electropolisher Struers TenuPol-5
Diamond-wire saw

Mactemps Download

Data Analysis and Simulations

Mactempasx

Aside from various computer codes developed by staff of the Electron Microscopy Center, which is used for the analysis and simulation for in-line electron holography, scanning transmission electron micrographs and low-loss electron energy-loss spectroscopy, the following commercially available computer programs are available:

Mactempasx Software

Simulation and data analysis: MacTempas & CrystalKit from Total Resolution
Simulations (TEM, STEM, Diffraction): xHREM from HREM Research
Simulation (TEM, STEM, Diffraction): JEMS
EELS simulation: Wien2K, FEFF8
First-principles programs for EELS simulations: Wien2k & FEFF8
Data analysis: Geometrical Phase Analysis and SmartAlign from HREM Research
Tomographic reconstruction: Inspect 3D from FEI and TomoJ running on ImageJ
3D visualization and volume analysis: Amira
Focal series reconstruction: TrueImage from FEI and MacTempas from Total Resolution
Other software tools for microscopy data: ImageJ, Gatan Digital Micrograph, FEI TEM Image & Analysis (TIA), FEI Velox, Bruker ESPRIT, Oxford INCA
Various 'home'-written skripts and programs are used for data analysis and simulations (based on Fortran77, Mathematica, MATLAB etc.)